高精度金属薄膜磁电阻效应测试系统  

High Accuracy Testing System for Magnetoresistive Effect of Metal Films

作　　者：王立锦[1] 于广华[1] 赖武彦[2] 朱逢吾[1] 

机构地区：[1]北京科技大学材料科学与工程学院,北京100083 [2]中国科学院物理研究所磁学国家重点实验室,北京100080

出　　处：《仪器仪表学报》2005年第12期1257-1261,共5页Chinese Journal of Scientific Instrument

基　　金：国家"863"高技术研究发展计划(19890310)资助项目

摘　　要：概述了探针法金属薄膜磁电阻效应测试的原理;分析了探针因子对测量结果的影响;设计组装了金属薄膜磁电阻效应的高精度测试系统,并给出了微机控制软件的关键子程序。该系统集数据采样、数据处理、参数计算等功能于一体,用户界面友好、测试范围宽、精度高。系统软件还能显示和打印测量结果的数据曲线,并可生成标准数据文件供OR IG IN等数据处理软件调用。The testing principle of the magnetoresistive effect of metal films by the probe-method was introduced. The effect of the probe factor on the measuring result was analyzed. A high accuracy testing system was designed and made, the key control subprogram for computer was given. This system gathers the functions of sampling data, processing data and calculating parameters together, and has a friendly interface, a wide test range as well as high precision. The system software can draw or output the curve of the measuring result at computer screen or printer, and it can produce the standard data files which support some data processing software such as ORIGIN.

关 键 词：金属薄膜 磁电阻效应 C语言 计算机辅助测试 IEEE-488 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置]