门级电路自动测试向量生成技术原理  

Principles of gated circuit automation test pattern generation.

作　　者：刘观生[1] 葛海通[2] 陈偕雄[1] 

机构地区：[1]浙江大学信息与电子工程系,浙江杭州310028 [2]浙江大学电气学院,浙江杭州310028

出　　处：《浙江大学学报（理学版）》2006年第1期52-57,共6页Journal of Zhejiang University（Science Edition）

基　　金：国家自然科学基金资助项目(NO.90207002)

摘　　要：集成电路的飞速发展使得测试的难度不断增加,而ATPG技术在测试向量产生方面具有重要的意义,本文对该技术的发展及其所采用的方法进行了系统地介绍和分析.针对门级的组合电路和时序电路的ATPG方法具有许多相似之处,但也同时存在各自的特点,在文中,对这两类电路的方法进行了仔细的比较、区分.With the development of integrated circuit, testing becomes more and more difficult. Automation test pattern generation （ATPG） is very important in test field. In recent years, many researchers payed attention to this topic, and improved this technology very much. In this paper, most methods and technologies about ATPG were introduced and analyzed in detail. All methods can be classified into two classes： one is based on determinate ATPG; the other is based on random-simulation ATPG. Many new methods were put forward in recent several years. All new and old methods were surveyed in the paper, and the progress process was also discussed. It is well known that sequential circuit ATPG is more difficult than combinational circuit but they have a very close relationship. The methods about combinational circuit can be applied in sequential circuit. At the same time, the APTG methods about gated combinational circuit and gated sequential circuit have many differences. All of the differences were analyzed and compared in detail in this paper.

关 键 词：ATPG 门级电路 测试 

分 类 号：TP391.76[自动化与计算机技术—计算机应用技术]