一种选择折叠计数状态转移的BIST方案  

A BIST Scheme Based on Selecting State Transition of Folding Counters

作　　者：梁华国[1] 方祥圣[1] 蒋翠云[2] 欧阳一鸣[1] 易茂祥[2] 

机构地区：[1]合肥工业大学计算机与信息学院,合肥230009 [2]合肥工业大学理学院,合肥230009

出　　处：《计算机研究与发展》2006年第2期343-349,共7页Journal of Computer Research and Development

基　　金：国家自然科学基金项目(60444001;90407008);安徽省自然科学基金项目(050420103);教育部留学回国人员科研基金项目(527)

摘　　要：提出了一种选择折叠计数状态转移的BIST方案,它是在基于折叠计数器的基础上,采用LFSR编码折叠计数器种子,并通过选定的存储折叠距离来控制确定的测试模式生成,使得产生的测试模式集与原测试集相等·既解决了测试集的压缩,又克服了不同种子所生成的测试模式之间的重叠、冗余·实验结果证明,建议的方案不仅具有较高的测试数据压缩率,而且能够非常有效地减少测试应用时间,平均测试应用时间仅仅是类似方案的4%·In this paper, a BIST scheme based on selecting state transition of folding counters is presented. On the basis of folding counters, LFSR is used to encode the seeds of the folding counters, where folding distances are stored to control deterministic test pattern generation, so that the generated test set is completely equal to the original test set. This scheme solves compression of the deterministic test set as well as overcomes overlapping and redundancy of test patterns produced by the different seeds. Experimental results prove that it not only achieves high test data compression ratio, but efficiently reduces test application time, and the average test application time is only four percent of the same type scheme.

关 键 词：内建自测试 折叠计数器 测试数据压缩 

分 类 号：TP391.7[自动化与计算机技术—计算机应用技术]