线阵CCD在高精度测径系统中的应用  

Application of Linear CCD in High Precision Diameter Measuring System

作　　者：马登极[1] 朱善安[1] 王长军[1] 

机构地区：[1]浙江大学电气学院,浙江杭州310027

出　　处：《计算机测量与控制》2006年第2期175-176,185,共3页Computer Measurement &Control

摘　　要：针对工业中用千分尺人工对工件直径测量的落后方法,文章设计了一套利用线阵CCD对直径实现精密测量的系统;该系统基于光学系统无接触性测量的基本原理,运用光学测量的理论和一般方法,设计并讨论了在实际运用中存在的问题及解决办法;实践证明,该系统运行稳定可靠,测量精度达到了微米级,可以用于实际的直径测量。A precision measuring system for diameter by use of linear CCD is introduced. It based on the basic principle of un- touched measurement in this optics system, applies general theory and methods of optics, the problems and the solutions for practical application are discussed. Testing results show that this system runs stably and accurately, the measuring precision is in the range of micron and can be employed in practical diameter measurement.

关 键 词：线阵CCD 测径光学系统 边缘点 

分 类 号：O432.2[机械工程—光学工程]