基于E语言的外部存储器接口的功能验证  

The Functional Verification of External Memory Interface Based on E Language

作　　者：金娟[1] 罗春[1] 

机构地区：[1]东南大学国家专用集成电路系统工程技术研究中心,江苏南京210096

出　　处：《电气电子教学学报》2006年第1期67-69,103,共4页Journal of Electrical and Electronic Education

摘　　要：在SoC设计中,传统功能验证方法已显示出其缺点,主要问题有:复杂验证场景难以构建;边缘情况难以覆盖。针对这些问题,业界提出了一种新的功能验证方法学——受限随机矢量生成的功能验证,该方法在满足约束条件的前提下,随机产生验证矢量。本文研究了受限随机矢量生成的功能验证在SoC设计中的应用,并以基于E语言和Specm an验证平台验证了SoC芯片中的外部存储器接口,给出了具体的验证环境和验证步骤。验证结果表明,复杂验证场景和边缘情况的覆盖率均达到了100%,极大地提高了验证的效率和质量。In SoC design, traditional functional verification method is confronted with some challenges： hard to make complex verification scenarios; difficult to cover corner cases. A new functional verification methodology based on generation of constraint-random testbench is presented in industry. This method of functional verification can randomly generate testbenches limited by some constraints, it resolves the challenges effectively. We use the verification platform of Specman and E language to verify EMI（External Memory Interface） of a SoC. We emphasize the procedures of setting up a verification environment. As result of verification, the coverage of complex verification scenarios and corner cases all reach 100%, the efficiency and the quality of the verification have been improved remarkably.

关 键 词：外部存储器接口 受限随机矢量 验证 覆盖率 

分 类 号：TP333.5[自动化与计算机技术—计算机系统结构] TP391.77[自动化与计算机技术—计算机科学与技术]