GaAs超高速数字集成电路测试研究  

Study on Measurement of GaAs Very High Speed Digital Integrated Circuit (GaAs VHSIC)

作　　者：李瑞钢 

出　　处：《半导体情报》1990年第3期16-20,57,共6页Semiconductor Information

摘　　要：本文简要介绍了GaAs起高速数字集成电路(VHSIC)测试技术的国际发展水平。对比较法测试系统中阻抗匹配与高频时钟信号的传输特性展开了深入的讨论,并给出了典型的GaAs BFL门瞬态性能的测试结果。使用此系统测出的SZ系列四种GaAs BFL门电路产品通过了专家级定型鉴定,为国内首批定型的VHSIC。The paper presents briefly the current state of the measuring technique for GaAs VHSID Impedance matching and transmission properties of HF clock signal in measuring system with comparison method are discussed in detail. The measurement of the transient characteristics of the typical GaAs BFL gates has been given. Four kinds of series SZ GaAs BFL gates measured by this system were qualified by the experts, The design of these VHSIC's was first finalized in our country.

关 键 词：数字 集成电路 GAAS 测试 

分 类 号：TN431.207[电子电信—微电子学与固体电子学]