模拟电路的单粒子瞬时效应  

Single-event transients(SET)in analog circuits

作　　者：陈盘训[1] 周开明[1] 

机构地区：[1]中国工程物理研究院电子工程研究所,绵阳621900

出　　处：《核技术》2006年第3期194-197,共4页Nuclear Techniques

摘　　要：综合介绍一种新的单粒子作用现象。模拟电路在单个重离子撞击下,在输出端产生瞬时信号,这种瞬时扰动可能影响到连接模拟电路输出端的电路,例如运算放大器的输出可能连接到数字计数器的输入端,由重离子引起放大器足够大的瞬时输出脉冲可能增加计数器的计数。另外,这种输出端的瞬时电压信号可能改变其它电路的状态。A new phenomenon of single- event upset is introduced. The transient signal is produced in the output of analog circuits after a heavy ion strikes. The transient upset can influence the circuit connected with the output of analog circuits. For example, the output of operational amplifier can be connected with the input of a digital counter, and the pulse of sufficiently high transient output induced by an ion can increase counts of the counter. On the other hand, the transient voltage signal at the output of analog circuits can change the state of other circuits.

关 键 词：模拟电路 单粒子瞬时 脉冲激光 线性能量转移 

分 类 号：O434.1[机械工程—光学工程]