同步辐射白光全反射XRF在痕量元素检测的初步应用研究  

Total Reflection X-ray Fluorescence Analysis with White Synchrotron Radiation Excitation

作　　者：吴应荣[1] 潘巨祥[1] 肖延安 巢志瑜[1] 洪蓉[1] 刘亚雯[1] 吴强[1] 

机构地区：[1]中科院高能物理研究所

出　　处：《分析测试学报》1996年第1期6-11,共6页Journal of Instrumental Analysis

摘　　要：叙述了同步辐射白光全反射Ｘ射线荧光分析的实验装置，给出了几种标准物质ＴＸＲＦ实验的检出限，并对实验结果进行了讨论。The experimental facility for total reflection X-ray fluorescence analysis with white synchrotron radiation is described.The minimum detection limits for several standard materials and samples have been obtained.The experimental results are discussed.

关 键 词：同步辐射 全反射 X射线荧光分析 痕量分析 

分 类 号：O657.34[理学—分析化学]