高速瞬态信号测试技术  

Testing Technique for High-Speed Transient Signal

作　　者：陈宇晓[1] 唐丹[1] 杨谟华[2] 陈敏德[1] 

机构地区：[1]中国工程物理研究院电子工程研究所,621000 [2]电子科技大学微电子与固体电子学院,610054

出　　处：《兵工自动化》2006年第3期60-60,共1页Ordnance Industry Automation

摘　　要：采用高速示波器法和电快脉冲取样法测试高速瞬态信号。高速实时示波器以高速AD变换为核心,取样示波器采用时域取样。基于信号延迟线的电快脉冲取样法,当单次瞬态信号在传输线内延迟到适当位置,各取样门同时打开取样。样品信号经过展宽、放大、处理后进行显示。High-speed transient signal is tested with the testing methods of high-speed oscillograph and fast electronics pulse sampling. The high-speed AD change is used as the core of high-speed oscillograph, and time domain sampling is applied for sampling oscillograph. For fast electronics pulse sampling method based on signal delay line, while single time transient signal is delayed to suitable position inside transmission line, every sampling gate is opened to sample at the same time. Sample signal was processed through spreading and amplifying and it was displayed.

关 键 词：瞬态信号 测试技术 高速 取样法 取样示波器 示波器法 延迟线 脉冲 

分 类 号：TN911.23[电子电信—通信与信息系统]