温度对还原增感立方体氯化银乳剂中光电子衰减的影响  

The Effect of Temperature on the Decay of Photoelectron in Cubic AgCl Grain Emulsion

作　　者：张伟[1] 田晓东[1] 张荣香[1] 张继县[1] 李晓苇[1] 

机构地区：[1]河北大学物理科学与技术学院,保定071002

出　　处：《信息记录材料》2006年第2期3-5,9,共4页Information Recording Materials

基　　金：国家自然科学基金资助项目(10274017);河北省自然科学基金资助项目(103097)

摘　　要：利用微波介电检测技术,测得还原增感立方体氯化银乳剂中自由光电子与浅束缚光电子衰减行为随还原增感温度的变化。实验发现还原增感温度变化会引起增感中心陷阱作用的变化:当还原增感温度较低时,增感中心起空穴陷阱作用,延缓光电子衰减;还原增感温度较高时,增感中心起深电子陷阱作用,加速光电子衰减。由此,我们得到了确定最佳增感温度的依据。The time-resolved spectra of free and shallow-trapped photoelectron are obtained by microwave dielectric spectrum detection technology for pure and reduction sensitized AgCI emulsion. The photoelectron action of sensitized emulsion is analyzed. The results indicate that the function of reduction sensitization center is hole trap at lower reduction sensitization temperature and the function of reduction sensitization center is deep electron trap at higher reduction sensitization temperature. In addition, the best reduction sensitization temperature is obtained from the change of photoelectron decay time with sensitization temperature.

关 键 词：还原增感 微波介电检测 卤化银 光电子 

分 类 号：TQ572.3[化学工程—精细化工]