最优地挑选若干个伪硬币(英文)  

Optimal Detection of a Number of Defective Coins

作　　者：綦明男[1,2] 刘三阳[1] 穆学文[1] 

机构地区：[1]西安电子科技大学应用数学系,陕西西安710071 [2]临沂师范学院数学系

出　　处：《工程数学学报》2006年第2期361-364,共4页Chinese Journal of Engineering Mathematics

基　　金：Shannxi Province Natural Science Foundation(2001SL03).

摘　　要：用一台理想设备在最少的测试次数中,从n个硬币中挑选出m个不同的伪硬币。在该文中,我们通过分析鉴别m个不同的伪硬币中的理想设备基本模型的结果,得到了在最坏的情况下的一个确定的测试过程,我们证明这个测试过程是一个最优分组测试过程。对于n个硬币中的m个相同伪硬币,给出了鉴别n个硬币中m个相同伪硬币的两个最优分组测试过程。This paper is concerned with the problem of with n - m standard coins, in the minimum detecting m different defective coins, mixed number with the group testing on an ideal device. In the paper the authors survey results from basic model of the ideal device in identifying the m different defective coins with an exact testing procedure in the worst case obtained. It is proved that the testing procedure is optimal. For m uniform defective coins, mixed with n - m standard coins, the two optimal group testing procedures in identifying the m different defective coins among n coins are obtained.

关 键 词：伪硬币 标准硬币 信息论下界 分组测试 

分 类 号：O236[理学—运筹学与控制论]