应力对铁电薄膜电滞回线及蝶形曲线的影响  

Effect of stress on the ferroelectric properties of ferroelectric film

作　　者：李琳[1] 周振功[1] 王彪[1] 

机构地区：[1]哈尔滨工业大学复合材料研究所,黑龙江哈尔滨150001

出　　处：《功能材料》2006年第4期580-582,590,共4页Journal of Functional Materials

基　　金：国家自然科学基金资助项目(50232030;10172030;10572043;10572155);黑龙江省自然科学基金资助项目(A0301);黑龙江省杰出青年基金资助项目(JC04-08)

摘　　要：应用与时间有关的Ginzburg-Landau方程(time dependent Ginzburg-Landau,简称TDGL方程),在考虑表面效应的条件下分析了应力对外延铁电薄膜铁电性能的影响。计算结果显示剩余极化强度值随着压应力的增加而增加,随着张应力的增加而减小。场致应变值随着压应力的增加而增加,随着张应力的增加而减小。这种变化趋势与实验结果是一致的。考虑表面效应计算得到的剩余极化强度值小于不考虑表面效应时计算得到的数值(当外推长度>0时)。Hysteresis loops of polarizations versus the applied electric field, the butterfly curve of strain versus the applied electric field in a ferroelectric film subjected to a stress field is simulated using the time-clepenclent Ginzburg-Landau equation, which take surface effect into account. The simulated result shows that the remanent polarization increases with compressive, decrease with tensile. For a positive extrapolation length, the polarization is reduced at the surface. Both of these trends qualitatively agree with experiments.

关 键 词：铁电薄膜 应力 极化强度 电滞回线 Ginzburg——Landau 

分 类 号：O342[理学—固体力学]