基于小波分析和虚拟仪器技术的1/f噪声研究  

Study of 1/f Noise by Means of Wavelet Analysis and Virtual Instrument Technology

作　　者：包军林[1] 庄奕琪[1] 杜磊[1] 李伟华[1] 马仲发[1] 万长兴[1] 

机构地区：[1]宽禁带半导体材料与器件教育部重点实验室,西安电子科技大学微电子研究所,西安710071

出　　处：《电子器件》2006年第2期369-372,共4页Chinese Journal of Electron Devices

基　　金：国家自然科学基金资助(60276028);国防预研基金资助(51411040601DZ014);国防科技重点实验室基金资助(51433030103DZ01)

摘　　要：传统基于傅立叶分析和频谱分析仪的微弱信号检测方法无法对1/f噪声进行实时、高速、精确的测量与分析。本文在以虚拟仪器为平台,内嵌小波分析的低频噪声检测系统基础上对1/f噪声进行了实验和理论研究。实验结果表明,该系统能够检测到的1/f噪声幅值比传统的测试方法低2个数量,以小波理论构建的两个参量更深入细微地表征了1/f噪声特性:模极大值分布能够鉴别不同类型的1/f噪声产生机构,相似系数可描述应力对器件1/f噪声的影响。As a traditional method, the system based on Fourier analysis and frequency spectrum analyzer can not be used to test 1/f noise timely, fast and accurately. A testing and analyzing system based on wavelet analysis and virtual instrument is set up, by which 1/f noise is studied in theory and experiment. Experimental results demonstrate that this system can be used to test 1/f noise which is lower two scale than what can be tested by a traditional system. Two parameters are presented based on wavelet theory and are well used to characterize 1/f noise： wavelet maxima can be used to probe differect generation mechanisms of 1/f noise and similarity coefficient to picture effects of stress on 1/f noise.

关 键 词：小波分析 虚拟仪器 1/f噪声 模极大值 相似系数 

分 类 号：TN36[电子电信—物理电子学] TN386.1