一台小型全反射X荧光分析装置的研制  

A Small Equipment of the Total Reflection X-Ray Fluorescence Analysis

作　　者：田宇纮[1] 王瑞光[1] 刘恺[1] 郑素华[1] 王景云 

机构地区：[1]烟台大学物理系

出　　处：《烟台大学学报（自然科学与工程版）》1996年第2期32-36,50,共6页Journal of Yantai University(Natural Science and Engineering Edition)

基　　金：国家自然科学基金

摘　　要：介绍了全反射Ｘ荧光分析技术的基本原理、特点．用自行设计研制的一台小型全反射Ｘ荧光装置对原样人发、考古样品等进行了测试、分析，分析灵敏度达几十ｐｇ～ｐｇ级．The basic principle, the characteristic, and the prospest of the total-reflection X-ray fluorescence (TXRF) analysis techniques are discussed . A TXRF analysis spetrometry has been set up. The samples of a single hair, bronze, water, and stafood are measured by the method of TXRF, and the dectetion sensitivity of 10-2～10-3ng level has also ben obtained.

关 键 词：全反射 灵敏度 相对荧光强度 X荧光分析仪 

分 类 号：O657.34[理学—分析化学]