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作 者:彭光含[1] 杨学恒[2] 刘济春[2] 李旭[2] 辛洪政[2] 刘安平[2]
机构地区:[1]湖南文理学院物电系,湖南常德415000 [2]重庆大学数理学院,重庆400030
出 处:《重庆大学学报(自然科学版)》2006年第6期87-89,93,共4页Journal of Chongqing University
基 金:国家自然科学基金资助项目(59775069)
摘 要:用IPC-205B型扫描隧道显微镜(STM)获得了纳米金刚石的三维表面形貌图和扫描隧道谱(STS).把绝缘体金刚石纳米化处理后,在一定的偏压下,获得了纳米金刚石的STM三维形貌图,观测了纳米金刚石表面形貌微观结构,测得了纳米金刚石的扫描隧道谱,估算出纳米金刚石的能隙宽度,并对纳米金刚石隧道谱和导电机理进行了分析.STM/STS实验不仅较好地解释了纳米金刚石导电性能的谱学机理,拓展了STM的应用领域,而且还可以作为绝缘材料纳米化处理后纳米晶粒结构及其能谱特征分析的重要研究手段.The STM three dimensions surface shape appearance figure and scanning tunneling spectrum (STS) of nanometer diamond are obtained by STM. IPC-205B developed by the authors. Insulator diamond films being transacted into nano-meter diamond particles, the STM three dimensions surface shape appearance figure of nano-meter diamond is gotten under a certain bias voltage . Then nano-meter diamond microstructure is observed. And the STS of nano - meter diamond is gained . Also it exhibits the energy gap breadth of nano-meter diamond. At the same time, the STS and conductive mechanism are analyzed. STM/STS studies can not only explain the spectrum study mechanism of conductive capability of nano-meter diamond and expand application field of STM, but also they may act as the important study means for nanometer crystal particles structure and energy spectrun character analyse after insulated material turns into nanometer crystal particles.
分 类 号:O562.6[理学—原子与分子物理]
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