合成试验的延弧回路设计及延弧效能研究  

Arc prolong circuit design and arc prolong efficiency study in synthetic test

作　　者：李庆余[1] 李玉春[1] 杨海芳[1] 李纬[1] 吴盛刚[1] 

机构地区：[1]中国电力科学研究院,北京100085

出　　处：《华通技术》2006年第2期11-15,共5页

摘　　要：论述了合成试验采取延弧措施的必要性,介绍了国内外大功率试验室通用的延弧方法和工作原理,提出了延弧回路的设计原则和参数计算方法,并对影响延弧效能的因素进行了分析,最后叙述了提高延弧成功率的措施以及今后可能出现的问题。The thesis expounds the necessity of application of arc prolong measure in synthetic test, introduces general practices of arc prolong methods and their working principle at home and abroad, and proposes design criteria and parameter calculating method for arc prolong circuit. Then the author analyzes factors which may influence arc prolong efficiency. Finally, the paper also points out measures to increase arc prolong success ratio and would-be problems in future.

关 键 词：合成试验 延弧回路 同步控制 延弧效能 

分 类 号：TM835[电气工程—高电压与绝缘技术]