聚酰亚胺静电损伤和取向作用失效的系统观测  

Systematical Observation of Polyimide Damaged by Static Electricity and Invalid for Orienting Role

作　　者：魏怀鹏[1] 李艳龙[1] 叶文江[1] 张志东[1] 

机构地区：[1]河北工业大学理学院,天津300130

出　　处：《液晶与显示》2006年第4期320-323,共4页Chinese Journal of Liquid Crystals and Displays

基　　金：河北省自然科学基金资助项目(No.103002);河北省高校重点学科建设项目资助

摘　　要：利用偏光显微镜、扫描电镜（SEM）和原子力显微镜（AFM）对聚酰亚胺（PI）表面正常区域和静电损伤区域进行系统观测。偏光显微镜的观测基于超扭曲向列相液晶显示（STN—LCD）的关态透射原理，并确定损伤区域的线度在50～100μm。用SEM区分静电损伤引起的“白点”与尘粒引起的“白点”，同时观测到电极被局域破坏，其线度沿电极边缘约20μm。通过AFM的直接观测发现，与正常区域比较损伤区域失去了沟槽结构，但仍然保持深度在10nm以内的二维无序凹凸结构，其原因为：损伤后PI对液晶分子取向作用失效的机制是沟槽结构的消失。By using polarizing microscope, scanning electron microscope （SEM） and atomic force microscope （AFM） ,the surface of polyimide （PI） in normal area and electrostatic damaged area are observed systematically. The observation by polarizing microscope is based upon the principle of off-state transmission of super twist nematic liquid crystal display （STN-LCD）. The width of damaged area is from 50 μm to 100μm. From the observation by using SEM, the ＂white point＂ caused by static electricity can be distinguished from the ＂white point＂ caused by dust. Meanwhile, it is also observed that the electrode is damaged in local area. The width of damaged area is about 20 μm along the edge of electrode. From the direct observation by using AFM, it is found that there is no groove structure in damaged area in contrast with normal area. However, there is still a two-dimensional disorderliness concave-convex structure whose depth is less than 10 nm. The conclusion is that the mechanism of invalid orienting of PI to liquid crystal molecules is due to the missing of the groove structure.

关 键 词：液晶显示 聚酰亚胺 静电损伤 偏光显微镜 扫描电镜 原子力显微镜 

分 类 号：O753.2[理学—晶体学]