氧化物－电解溶液界面的表面基吸附模型研究  

Surface-Site Adsorption Model for Oxide/Aqueous Electrolyte Interface

作　　者：牛蒙年[1] 丁辛芳[1] 童勤义 

机构地区：[1]东南大学微电子中心

出　　处：《Journal of Semiconductors》1996年第6期458-463,共6页半导体学报（英文版）

摘　　要：基于统计物理学和两层吸附模型提出氧化物－电解溶液（ＯＡＥ）界面的表面基吸附模型，推导出完全由微观物理、化学参量描述的ＯＡＥ界面电荷密度与电势的关系表达式，结果与实验数据的拟合在零电荷点附近令人满意，并对理论结果进行了讨论．Abstract Based on the statistical physics and two-layer adsorption model, surface-site adsorption model for oxide/aqueous electrolyte (OAE) interface is presented. The derived expression of the charge density per unit area as a function of the potential of the OAE interface is exclusively described by microscopic physico-chemical parameters. With the fitted-paremeter approach, the best fitting with the experiments is aroud the point of zero charge (pHpzc) of the OAE interface. The theoretical results are also discussed.PACC: 8265, 7340, 0520, 0650

关 键 词：OAE界面 表面基吸附模型 场效应器件 

分 类 号：TN386[电子电信—物理电子学]