单根氧化锌纳米带/Au电极体系I-V特性的测量  

Current-voltage characteristics of single zinc oxide nanobelt/gold electrodes system

作　　者：李萌[1] 孙连峰[2] 乔利杰[1] 

机构地区：[1]北京科技大学材料物理系,北京100083 [2]国家纳米科学中心,北京100080

出　　处：《电子显微学报》2006年第4期320-323,共4页Journal of Chinese Electron Microscopy Society

摘　　要：利用电子束刻蚀和真空蒸镀法,在单根氧化锌纳米带和SiO2/Si片上,制备了金纳米电极,采用四端法对氧化锌纳米带的电流-电压(I-V)特性进行测量。实验发现氧化锌纳米带/金电极组成的体系存在三种完全不同的I-V特性曲线,分别为对应于较小电阻的非对称阀值型曲线以及电阻较大的整流型和线性对称曲线。我们认为这主要是由于氧化锌纳米带和电极的接触情况不同所造成的。测量表明器件在不同环境下(空气和真空)具有不同的I-V特性。表现在当测量环境由空气变为真空时,前一类的I-V特性变化不大,而后一类由整流型变为线性对称型。E-beam lithography and vacuum evaporating methods were used to form four gold electrodes on single ZnO nanobh and SiO2/Si wafer. Four terminal electrical transport measurements were conducted on semiconducting nanobelt and three distinct I-V characteristics were observed. Deciding to metal-semiconductor （MS） contact, asymmetric valve current type curve was corresponding to a much lower MS contact resistance, and the curve did not change largely under ambient and vacuum testing condition ; at larger contact resistance, almost rectifying and almost linear curves are observed which was corresponding to ambient and vacuum condition respectively. It appeared that the adsorption of oxygen on ZnO naobelt/Au electrodes system played a key role to the semiconducting nanobeh.

关 键 词：ZNO纳米带 肖特基热垒 接触电阻 界面态密度 

分 类 号：TB383.1[一般工业技术—材料科学与工程]