基于I/O的黑盒测试用例集约简技术改进  

Improvement of black-box test reduction method with I/O analysis

作　　者：孙继荣[1] 李志蜀[2] 殷锋[2] 王莉[2] 李奇[1] 

机构地区：[1]四川师范大学软件重点实验室,四川成都610066 [2]四川大学计算机学院,四川成都610064

出　　处：《计算机应用》2006年第9期2232-2235,2239,共5页journal of Computer Applications

基　　金：四川省重点科技项目(05GG021-003-2);四川师范大学软件重点实验室资助项目;西南民族大学青年重点项目(05NQZ001)

摘　　要：利用I/O关系对测试用例集进行约简和优化的思想,首先对I/O关系自身进行约简,然后进行关联性分析,划分成若干个彼此独立的相关组;接着对各相关组分别进行处理:仅对每个输出涉及到的输入变量进行组合覆盖,进而利用组内元素的关联性通过公共元素进行水平拼接;最后再把各个相关组的结果进行水平拼接。结果表明改进后的方法可以产生数量最少的用例集。P.J. Schroeder proposed a method into test reduction using I/O relations without any loss of fault detection capability. But all his algorithms were not satisfactory, whether due to complexity or bad result. This paper improved the method by making full use of the information about I/O relations. First, I/O relations themselves were minimized; then, the I/O relations were partitioned into several relevant groups according to the relevancy analysis. Thirdly, each relevant group was regarded as independent I/O relations to produce reduced test suite： a combinational test suite was created for each output and then scrabbled up on common element. At last, the union of the results from all groups was just our final target. The experimental results show that the improved method can produce the smallest suite.

关 键 词：黑盒测试 测试用例集约简 组合测试 I/O关系分析 相关组 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]