Testing Cross-Talk Induced Delay Faults in Digital Circuit Based on Transient Current Analysis  

作　　者：WANG Youren DENG Xiaoqian CUI Jiang YAO Rui ZHANG Zhai 

机构地区：[1]College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, Jiangsu, China

出　　处：《Wuhan University Journal of Natural Sciences》2006年第6期1445-1448,共4页武汉大学学报（自然科学英文版）

基　　金：Supported by the National Natural Science Foun-dation of China (60374008 ,60501022)

摘　　要：The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines （SVM） classifier was proposed in this paper. Firstly, the fault model induced by cross-talk effect and the IDDT testing method were analyzed, and then a delay fault localization method based on SVM was presented. The fault features of the sampled signals were extracted by wavelet packet decomposition and served as input parameters of SVM classifier to classify the different fault types. The simulation results illustrate that the method presented is accurate and effective, reaches a high diagnosis rate above 95%.The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines （SVM） classifier was proposed in this paper. Firstly, the fault model induced by cross-talk effect and the IDDT testing method were analyzed, and then a delay fault localization method based on SVM was presented. The fault features of the sampled signals were extracted by wavelet packet decomposition and served as input parameters of SVM classifier to classify the different fault types. The simulation results illustrate that the method presented is accurate and effective, reaches a high diagnosis rate above 95%.

关 键 词：delay fault CROSS-TALK fault localization digital circuit IDDT SVM 

分 类 号：TP305[自动化与计算机技术—计算机系统结构]