基于AVR ATmega169的张力检测仪设计  

Design of Strain Gauge Based on AVR ATmega169

作　　者：王海棠[1] 黄琦兰[1] 

机构地区：[1]天津工业大学,天津300160

出　　处：《现代电子技术》2006年第22期9-11,共3页Modern Electronics Technique

摘　　要：分析应变测量原理,应用应变片敏感栅作为传感器,结合仪表放大器电路和高集成度的单片机ATmega169实现低功耗便携式张力测试仪的设计。该系统功耗低、测量准确、直接数字读出,具有多种附加功能。成功解决了由经验判断引起的偏误过大问题。给出在实际应用中硬件电路和软件程序的实现方案。分析设计中常见的问题,并给出解决问题的思路。对相关的测量仪表设计、开发有一定参考作用。The paper analyzes the theory of strain gauge measurement,finishes the strain gauge tester design through applying strain gauge active grid as sensor element,rail to rail low voltage op - amp as instrument amplifier and high density integrated ATmega169 microcomputer as the processor. It takes on low power consumption, high accuracy measurement, LCD display and other auxiliary functions. It solving the problem of high measurement error caused by subjective judgment. The paper introduces the design idea of the hardware circuit and software program in practical application. Analyzing the probable problem in design and giving the idea of solving it. It helps to design or development of relevant measurement instruments.

关 键 词：AVR ATmega169 应变计 仪表放大器 

分 类 号：TP212.9[自动化与计算机技术—检测技术与自动化装置]