一种逻辑内建自测试移相器的设计方法  

A Phase Shifters Method for Built-in Self Test

作　　者：孙家亮[1] 张岩[1] 谷岚[1] 

机构地区：[1]哈尔滨工业大学深圳研究生院片上系统研究中心,广东深圳518055

出　　处：《微电子学与计算机》2006年第12期61-64,共4页Microelectronics & Computer

摘　　要：针对内建自测试移相器,提出了一种基于逻辑仿真移相器设计和改进的快速算法。只需对n阶LFSR(LinearFeedbackShiftRegister)进行2n-1个周期仿真即可得到合适的移相选择矢量,由这些选择矢量构成值胞。该方法得到的移相器选择矢量清晰地反映了值胞的组成和分布情况,从而避免了对偶LFSR的多次前向、后向仿真,降低了移相器的设计时间。对比实验表明,该方法是有效的,并且其硬件电路实现具有更小的硬件开销。A fast and improved phase shifiers method for BIST is introduced based on logic simulation, The proper phase shifter selection vectors can be obtained by simulating n-stage LFSR （Linear Feedback Shift Register）2^n-1 cycles, the value cells are composed of these selection vectors. The selection vectors, which are obtained by this method, reflect the components and distributions of value cells clearly, thus avoid a number of forward and backward simulations of dual LFSR, the design time of phase shifters is reduced. Compared with the experiment results, the proposed method shows its effectiveness and the hardware cost of phase shifter is minimized.

关 键 词：内建自测试 线性反馈移位寄存器 移相器 值胞 

分 类 号：TN302[电子电信—物理电子学]