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作 者:曹为民[1] 石新红[1] 印仁和[1] 姬学彬[1] 张磊[1] 曹赟[1]
出 处:《电镀与精饰》2007年第1期1-4,26,共5页Plating & Finishing
基 金:国家自然科学基金(20271062);上海市教委青年基金(02AQ83)资助项目
摘 要:在硼酸镀液中以单晶S i(111)为基底用双槽法制备Cu/Co多层膜,在镀液中分别加入了镀铜添加剂2000#和镀钴添加剂5#。探讨了镀层电结晶成核机理,在基础镀液中铜电结晶为三维连续成核过程,钴电结晶在较低电位下为三维连续成核,在较高电位下为三维瞬时成核过程。加入添加剂后,铜、钴电结晶均为三维瞬时成核过程。测试了Cu/Co多层膜的磁性能;添加剂能提高多层膜的磁性能,无添加剂的Cu/Co多层膜的巨磁阻(GMR)值约为5%,而在加入了添加剂后,其GMR值高达52%。Cu/Co multilayers were prepared on monocrystalline silicon (111) by using double-bath method in boric acid solution with additives added. The effects of additives on Cu/Co multilayers and the mechanism of nucleation were studied. The experiment results show that the growth kinetics for Cu is consistent with progressive nucleation. And for Co, there is a transition from progressive to instantaneous nucleation at about 1.2 V. In addition, GMR values were measured by PPMS at room temperature. The results show that: Additives can enormously improve the magnetism of the multilayers. GMR value of Cu/Co multilayers without additives was only about 5%. While with additives, the GMR value was up to 52%.
分 类 号:TQ153[化学工程—电化学工业]
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