Effect of ion implantation upon erosion resistance of polyimide films in space environment  

作　　者：多树旺 李美栓 周延春 

机构地区：[1]Jiangxi Key Laboratory of Surface EngineeringJiangxi Science and Technology Normal University,Nanchang 330013, China [2]Shenyang National Laboratory for Materials Science,Institute of Metal Research,Chinese Academy of Sciences,Shenyang 110016,China [3]Shenyang National Laboratory for Materials ScienceInstitute of Metal Research,Chinese Academy of Sciences,Shenyang 110016,China

出　　处：《中国有色金属学会会刊：英文版》2006年第B02期661-664,共4页Transactions of Nonferrous Metals Society of China

基　　金：Project (G19990650) supported by the National Key Basic Research and Development Program of China

摘　　要：The atomic oxygen (AO) resistance of Si ion implanted polyimide films in the ground-based AO simulation facility was investigated by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). The results show that at the initial stage of AO exposure the implanted sample has a small mass change, and then is stabilized. The erosion yield of the implanted polyimide film decreases by about two orders of magnitude compared with that of the polyimide film. The analysis through XPS and AES indicates that a continuous high-quality protective oxide-based (SiO2) surface layer is formed on the implanted polyimide films after the AO exposure. It can provide high-quality erosion protection for these materials. The implanted polyimide fully restores its original color and the carbonization effect disappears on the whole after AO exposure. Thermal-optical properties and surface morphology of the implanted polyimide materials are not altered. The modified materials have a markedly increased erosion resistance in AO environment.The atomic oxygen （AO） resistance of Si ion implanted polyimide films in the ground-based AO simulation facility was investigated by scanning electron microscopy （SEM）, X-ray photoelectron spectroscopy （XPS） and Auger electron spectroscopy （AES）. The results show that at the initial stage of AO exposure the implanted sample has a small mass change, and then is stabilized. The erosion yield of the implanted polyimide film decreases by about two orders of magnitude compared with that of the polyimide film. The analysis through XPS and AES indicates that a continuous high-quality protective oxide-based （SiO2） surface layer is formed on the implanted polyimide films after the AO exposure. It can provide high-quality erosion protection for these materials. The implanted polyimide fully restores its original color and the carbonization effect disappears on the whole after AO exposure. Thermal-optical properties and surface morphology of the implanted polyimide materials are not altered. The modified materials have a markedly increased erosion resistance in AO environment.

关 键 词：聚酰亚胺 原子氧 离子注入 表面变性 耐蚀性 空间环境 

分 类 号：TB383.2[一般工业技术—材料科学与工程]