基于ARM内核微处理器的光栅位移测量系统  

Raster Displacement Measure System Based On ARM Micro Processor Unit

作　　者：陈海燕[1] 屠恒海[1] 

机构地区：[1]哈尔滨理工大学自动化学院,150080

出　　处：《中国科技信息》2007年第4期89-91,共3页China Science and Technology Information

摘　　要：本课题主要体现了一种基于ARM处理器的光栅位移测量系统的设计思想,硬件电路上采用了以ARM7TDMI-S为核心的LPC2210作为中央处理器,配合光栅信号处理模块对数据信号进行处理;软件上以C语言为基础,以ADS1.2为平台进行模块化编程。The problem has embodied one kind of design method that grating displacement measurement system-based on ARM processor, the hardware has adopt LPC2210 centering on ARM7TDMI-S to be central authority processor , handled in coordination with that the grating signal treatment module is in progress to data signal on the circuit; Take C language as basis on the software, take ADS1. 2 as platform carry out the modularization programming.

关 键 词：光栅 莫尔条纹 ARM ADS1.2 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]