普克尔斯效应反射法测量绝缘膜表面放电电荷的分布  

MEASURING SURFACE DISCHARGE CHARGE DISTRIBUTION ON INSULATION FILMS BY REFLECTION METHOD OF POCKELS EFFECT

作　　者：王友功[1] 川崎俊之 高田达雄 

机构地区：[1]西安交通大学 [2]武藏工业大学电气工程学院绝缘研究所

出　　处：《西安交通大学学报》1996年第11期51-57,共7页Journal of Xi'an Jiaotong University

摘　　要：介绍用普克尔斯效应反射测量系统测量绝缘膜上表面电荷分布的方法，与原来的透射法相比，反射法可以避免薄膜本身光学特性的影响，因而提高了测量准确度．采用高速光检出装置，反射法可用于测量直流、脉冲及交流沿面放电时绝缘膜上表面电荷密度及分布．文中较详细地介绍了低密度聚乙烯膜交流沿面放电时表面电荷分布的测量结果．A measurement method by reflection system of Pockels effect for surface charge distribution on the insulation films has been introduced. Compared with the transparent method of Pockels effect,the reflection method can avoid the effect of optical properties of the film itself on the measurement accuracy.Using the HVC equipment,the reflection method could be applied to measure the surface charge density and distribution due to surface discharge under DC,AC and impulse voltage. The measurement results of surface charge distribution on LDPE films during AC surface discharge are reported in detail as an example.

关 键 词：表面电荷 普克尔斯效应 沿面放电 绝缘膜 反射法 

分 类 号：TM835.4[电气工程—高电压与绝缘技术] TM930.126