数字电路串扰故障测试的路径敏化方法研究  

Study on the Test Approach for Crosstalk Faults in Digital Circuits by Sensitizing Path

作　　者：潘中良[1] 陈翎[1] 

机构地区：[1]华南师范大学物理与电信工程学院

出　　处：《自动化与信息工程》2007年第1期1-4,共4页Automation & Information Engineering

基　　金：国家自然科学基金(60006002);广东省教育厅自然科学研究项目(02019)资助

摘　　要：数字电路集成度的提高特别是近年来系统芯片的出现,信号线之间的间距不断缩小,使得信号线间容易发生串扰。文章首先对串扰故障模型,特别是信号线间容性和感性耦合所产生的串扰及其特征进行了讨论,其次针对数字电路中串扰故障的检测,研究了基于路径敏化的测试矢量生成方法,给出了方法的实现步骤。In the current VLSI circuit design technologies, due to the increased device density and circuit speed, crosstalk effects are induced between some circuit elements. The crosstalk effects can results in faulty behavior, therefore it is needed to tackle in circuit validation and test. In this paper, the crosstalk being produced by the coupling of capacitance and inductance are discussed, a test approach using sensitizing path technique for crosstalk faults in digital circuits is studied. The implementation steps of the approach are given in detail, the experimental results on some benchmark circuits show the approach proposed is feasible.

关 键 词：数字电路:故障检测 串扰故障 测试生成 

分 类 号：TN79[电子电信—电路与系统]