微波功率器件动态试验系统  

Dynamic Testing System for Power Microwave Devices

作　　者：来萍[1] 张晓明[1] 荣炳麟[2] 冯敬东[1] 范国华[2] 金毓铨[2] 

机构地区：[1]中国赛宝实验室电子元器件可靠性物理及其应用技术国家级重点实验室,广州510610 [2]南京电子器件研究所,南京210016

出　　处：《半导体技术》2007年第5期451-454,共4页Semiconductor Technology

摘　　要：为开展微波功率器件动态加速寿命试验,建立了一套由计算机实时监测的微波动态试验系统。采用微带电路剥离以及加热部件与其他电路的隔热连接等方法,实现了对每个器件进行独立的内腔式加热,从而单独提高受试器件环境温度,保证了高温应力下微波动态电路的稳定性和可靠性。同时编制了计算机程序软件,解决了参数校准、参数提取等方面存在的误差修正及提高测试精度等技术问题,实现了对试验过程的实时监测和数据的完整保存。In order to carry on the dynamic lifetime systems were built up with computer monitoring on line. testing for microwave power devices, a set of testing Separate microstrip circuit design and the heat isolating techniques were used to heat up the DUT separately. So that the stability problem were solved when the DUT was operating in high temperature and RF state. Meanwhile, a computer was used to monitor the testing procedure, record and keep the key parameters. The monitor software was written independently.

关 键 词：微波功率器件 动态 试验系统 

分 类 号：TN323.4[电子电信—物理电子学] TN306