全反射X荧光分析技术的应用  

The application of TXRFanalysis technique

作　　者：刘恺[1] 郑素华[1] 王瑞光[1] 张郁辉 

机构地区：[1]烟台大学

出　　处：《核技术》1997年第1期1-5,共5页Nuclear Techniques

基　　金：国家自然科学基金

摘　　要：简要地介绍了全反射Ｘ荧光分析技术和一台小型全反射Ｘ荧光分析装置。这台装置的最低检出限对于Ｃｏ元素在Ｃｕ靶Ｘ光管激发下是７ｐｇ，对Ｓｒ元素、Ｍｏ靶是３０ｐｇ。对自来水，海洋动物、头发等进行了应用分析实验。The total reflection X-ray fluorescence(TERF)analysis technique is introducedbriefly.A small TXRF analyzre charactreised by doubld path X-ray exciting sources and stecially short optical path (15cm) is described. Low minimum detection limit(MDL),e.g.7pg for Co element under Cu target tube operating at 20kVand 6mA and 30pg for Sr under Mo target tube at 46kV and 10mA,is achieved. Some analysis experiments for tap water,marine animal and human hair are performed and the resrlts are given.

关 键 词：全反射 X荧光 多元素分析 XRF 

分 类 号：O657.34[理学—分析化学]