检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
机构地区:[1]清华大学机械工程系功能薄膜研究室,北京100084
出 处:《太阳能学报》2007年第5期499-503,共5页Acta Energiae Solaris Sinica
摘 要:采用中频交流磁控溅射方法制备了CuIn、CuAl和CIA合金膜。并用SEM及XRD观察和分析了各种薄膜的表面形貌、成分和组织结构,着重分析了靶功率密度对薄膜成分、晶体结构的影响。结果表明,通过调节靶功率密度,能精确控制薄膜中CuI、n、Al比例。制备得到了Cu/(In+Al)原子比接近1,且Al/(In+Al)比例可调的成分分布均匀的CIA薄膜。CIA前驱膜是以CuIn和In为基础相,Al原子主要是以替代In原子的固溶体形式存在。当溅射CuIn合金靶和CuAl复合靶的功率密度分别为0.20和0.15 W/cm2时,可制备得到由Cu11In9和CuIn两相组成的理想的CIA前驱膜。Culn, CuAl and CulnAl (CIA) precursor films were prepared using middle frequency magnetron sputtering. SEM and XRD were used to observe and analyze the surface morphologies, compositions, and microstructures of the various films. The effects of sputtering power on compositions and microstructures of films were analyzed intersively. The results showed that the atomic ratios of Cu, In and Al in the films can be controlled accurately by adjusting the sputtering power. The CIA precursor films with a Cu/(In + M) atomic ratio of approaching 1 and an adjustable Al/(In + Al) ratio and with uniform distribution of all alloys were obtained. CIA precursor film is composed of Culn phase and In phrase. A1 exists mainly in solid solution by substituting In. Ideal CIA precursor film consists of both Cun In9 and Culn phases which were obtained under the sputtering power of 0.20 and 0.15 W/cm^2 for CuIn and CuAl targets, respectively.
分 类 号:TM615[电气工程—电力系统及自动化]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.222