用于存储器测试的“透明”的可编程BIST方法(英文)  

Transparent based programmable BIST scheme for memory test

作　　者：王颖[1] 陈和[1] 

机构地区：[1]北京理工大学信息工程学院,北京100081

出　　处：《电子测量技术》2007年第4期5-8,共4页Electronic Measurement Technology

摘　　要：本文提出了一种用于存储器测试的新方法“透明”的可编程BIST方法。该方法可以覆盖几乎所有的故障模型,并且,由于测试生成算法和数据背景的结合,提供了灵活无约束的数据背景,因而增加了检测非模型化故障的可能性。通过实验评估了本文方法的性能和面积开销。This paper introduces a new approach for memory test： transparent-based programmable memory BIST solution. This approach can cover almost all fault models and increase the probability to detect un-modeled faults because of the combination of the test algorithm with the data backgrounds and by providing unlimited background flexibility. A case of study has been presented, and the capability of this approach and its costs of area have been evaluated.

关 键 词：存储器 “透明”的可编程内建自测试 算法 故障模型 

分 类 号：TN407[电子电信—微电子学与固体电子学]