利用过采样技术提高ADC测量分辨率  

Improving the Resolution of ADC by Over-sampling

作　　者：刘青兰[1] 方志刚[1] 邵志学[1] 

机构地区：[1]解放军理工大学工程兵工程学院,江苏南京210007

出　　处：《现代电子技术》2007年第12期74-76,79,共4页Modern Electronics Technique

摘　　要：针对目前单片机内嵌ADC分辨率较低,而外接高分辨率ADC成本又较高的情况,提出了用“过采样”技术使在有用的测量频带内的信噪比得到改善,从而提高ADC测量的分辨率。并利用Matlab对其结论进行仿真,且在TMS320LF2407 DSP上予以实现,结果表明信噪比和测量分辨率明显提高。Due to low resolution of ADC in the present MCU and high cost if ADC of high resolution is used,the over-- sampling technology is given to improve the signal noise rate in the useful measuring frequency consequently the resolution of ADC is increased. The simulation of results is made by Matlab and an implementation is also done in a TMS320LF2407 DSP, and the result shows that SNR and measuring resolution is obviously improved.

关 键 词：过采样 模/数转换器 数据采集 数字信号处理 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]