扫描电镜及X射线能谱仪在首饰镀层检测中的应用  

APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS

作　　者：谭莹[1] 张震坤[1] 陈明[1] 曹标[1] 刘健斌[1] 

机构地区：[1]广东出入境检验检疫局技术中心,广州510623

出　　处：《理化检验（物理分册）》2007年第4期185-187,共3页Physical Testing and Chemical Analysis(Part A:Physical Testing)

摘　　要：采用扫描电镜及X射线能谱仪对首饰镀层进行了检测,并对两种方法进行了比较。结果表明,镀铑首饰采用无损检测法较合适,而镀金首饰采用破坏性检测法较合适。The plating layers of ornaments were inspected by SEM and EDS respectively. The result showed that the ornaments plating with Rh are suitable to be inspected by nondestructive testing method and the ornaments plating with Au are suitable to be inspected by destructive method.

关 键 词：首饰镀层 扫描电镜 X射线能谱仪 检测 

分 类 号：TG115.23[金属学及工艺—物理冶金]