基于热刺激电流的硅橡胶合成绝缘子老化诊断方法初探  

Primary Research on the Diagnosis of Aging Silicone Rubber Insulators Using Thermally Stimulation Current

作　　者：梁英[1] 丁立健[1] 李成榕[1] 杨堃[1] 屠幼萍[1] 

机构地区：[1]华北电力大学高电压与电磁兼容北京市重点实验室,北京市昌平区102206

出　　处：《中国电机工程学报》2007年第21期7-12,共6页Proceedings of the CSEE

基　　金：国家自然科学基金项目(50577020)。~~

摘　　要：初步研究了用热刺激电流(TSC)技术进行硅橡胶合成绝缘子老化状态评估诊断的可行性。首先研究各种试验参数对硅橡胶合成绝缘子TSC特性的影响,结合不同测试条件的硅橡胶绝缘子陷阱电荷趋势图,确定一种合适的TSC试验参数,并在此给定的试验参数下,对比研究同一厂家新旧2批合成绝缘子的TSC特性。初步试验发现,新旧绝缘子的TSC测试结果明显不同。结合绝缘子的憎水性测试及微观结构分析发现,TSC测试结果与憎水性、微观结构之间存在一定联系。研究结果表明,如果深入系统地研究TSC特性与老化特性之间的关系,TSC技术有可能成为硅橡胶合成绝缘子老化程度评价及诊断的新方法。Diagnosis of aging silicone rubber（SIR） insulator using thermally stimulation current（TSC） technique is investigated. Firstly, based on experimental results of the influence of test conditions on SIR TSC characteristics, proper TSC test parameters have been concluded with corresponding developing trends of trapped charges. Then TSC of two different insulators made from the same manufacturer were measured under given test parameters. It is found that the TSC results of new and old insulators are obviously different. Considering the analysis of hydrophobicity and microstructure, it is indicated that there might be some relationship among the TSC, hydrophobicity and microstructure. It is believed that the TSC technique might be a new method for evaluating and diagnosing the aging SIR insulators.

关 键 词：热刺激电流 硅橡胶 合成绝缘子 老化诊断 陷阱电荷 

分 类 号：TN21[电子电信—物理电子学]