OLED有源驱动TFT阵列的一种测试方法  

A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode

作　　者：刘雪强[1] 张彤[1] 王丽杰[1] 夏志强[1] 李明友[1] 刘式墉[1] 

机构地区：[1]吉林大学电子科学与工程学院,长春130012

出　　处：《Journal of Semiconductors》2007年第7期1161-1164,共4页半导体学报（英文版）

摘　　要：提出了一种检测有源驱动OLED TFT阵列的方法,这种电流检测方法是结合TFT的制作工艺进行的.在只增加一块光刻版的情况下,有效地解决了在含有2个TFT的单元像素电路中,检测驱动管困难的难题.这种检测方法能够进行快速的全屏检测,具有精度高,对TFT阵列无损伤的特点.A novel method is used to evaluate the quality of a TFT array for an active matrix OLED,which can measure the characteristics of TFTs in a 2-T pixel circuit and detect the defects. The proposed testing method is carried out simultaneously with the fabrication processes. Without changing the fabrication processes, only one mask is added to judge the working states of the switch transistor and driving transistor in the pixel circuit. It is a current testing method,which has several advantages including fast response time, high precision, and no damage to the display.

关 键 词：TFT OLED 有源驱动 电流检测 仿真模拟 

分 类 号：TN141[电子电信—物理电子学]