高压脉冲方波下介质寿命试验击穿判断及控制装置的设计  

The Design of Breakdown Judgment and Control Device for the Dielectric's Life Testing under Pulse High Voltage

作　　者：雷克刚[1] 吴广宁[1] 高波[1] 何景彦[1] 

机构地区：[1]西南交通大学电气工程学院,610031

出　　处：《电气应用》2007年第7期84-87,共4页Electrotechnical Application

基　　金：国家自然基金资助项目(50377035);霍英东教育基金(91060);博士点基金(20050613008)

摘　　要：多路高压脉冲方波下聚酰亚胺薄膜寿命试验中,提出了使用PTC热敏电阻作为传感器来检测聚酰亚胺薄膜是否击穿的方法。检测回路采用差动平衡方式,能有效消除环境温度变化引起的干扰,且具有较高的灵敏度。此方法与高压回路没有直接电气连接,故安全性很高。依据此法设计的检测系统已经获得了实际应用。It＇ s important to detect the breakdown signals of the polyimide films in the life testing under pulse high voltage. A new way by thermal resistor is presented to make it possible based on monitoring the temperature of the limiting resistors which are placed in HV circuit. In order to gain a good antijamming ability, the balance measuring circuit is proper and good sensitivity must be with appropriate circuit parameter. It＇ s also safer to persons because there is no direct contact to the HV circuit. The device based on this way has been applied in practice.

关 键 词：方波 击穿 热敏电阻 差动平衡 

分 类 号：TM835[电气工程—高电压与绝缘技术]