单轴晶体双折射率随温度变化的双光路测量  

Measurement of birefringence of a single axis crystal varying with temperature based on double light paths

作　　者：倪志波[1] 宋连科[1] 刘建苹[2] 彭捍东[1] 周文平[1] 

机构地区：[1]曲阜师范大学激光研究所,曲阜273165 [2]曲阜师范大学物理系,曲阜273165

出　　处：《激光技术》2007年第4期358-359,363,共3页Laser Technology

摘　　要：为了研究单轴晶体最大双折射率在某一波长下随温度的变化情况,根据偏振光干涉的理论分析,推导出了单轴晶体最大双折射率随温度变化的解析式。在此基础上,设计、建立了一套双光路对比测试实验系统。利用该实验系统对石英晶体样品进行测试,获得了其实验数据变化曲线,并总结出了在测试波长下,石英晶体最大双折射率随温度变化的数学式。结果表明,单轴晶体在某一波长下的最大双折射率基本上与温度成线性关系;实验过程中,只要精确调整仪器,并注意控制好实验所需温度,其测量结果是可靠的。In order to measure the variation of birefringence varying with temperature when incident wavelength is fixed, firstly,the formula of the birefringence of a single axis crystal varying with temperature was deduced according to the theory of polarized light interference. Then an experimental system with double beam paths was set up for comparing measurement. With this system, a sample of quartz was measured and the curve of birefringence vs. temperature was drawn. After analyzing the test results, a formula of birefringence vs. temperature was obtained. The results indicate that, when the incident wavelength is fixed, the relationship between birefringence and temperature is linear. In the experimental process, if the instrument is regulated well and the temperature is contorlled properly, the test result is reliable.

关 键 词：晶体光学 双折射率 双光路 单轴晶体 温度 

分 类 号：O734.2[理学—晶体学]