基于同步谐振器的COM参数提取  

The COM Parameter Extraction Technology Based on One Port Synchronous Resonators

作　　者：聂广琳[1] 汤劲松[1] 

机构地区：[1]四川压电与声光技术研究所,重庆400060

出　　处：《压电与声光》2007年第4期376-378,共3页Piezoelectrics & Acoustooptics

摘　　要：介绍了一种基于单端同步谐振器、采用电测试方法实现漏波COM参数的提取技术。该同步谐振器中心频率为350 MHz,压电基片选用36°LT,铝、铜膜厚达240 nm。通过测试同步谐振器的导纳曲线来提取COM参数,并对提取出的COM参数进行了验证。This paper presents a novel leaky surface wave COM parameter extraction technology propagating on 36°-LiTaO3. Center frequency of a synchronous resonator with Al and copper film thickness up to 0. 02λ is 350 MHz. These COM model parameters are determined by using a new technique based on admittance measurements of a one port synchronous resonator. The experiment admittance is coincident with the simulation admittance.

关 键 词：COM模型 漏波 单端同步谐振器 导纳 

分 类 号：TN65[电子电信—电路与系统]