基于蚂蚁路径的I_(DDT)测试生成  

I_(DDT) Test Generation Based on Ant Algorithm

作　　者：曾晓杰[1,2] 邝继顺[1] 

机构地区：[1]湖南大学计算机与通信学院 [2]娄底职业技术学院,娄底417000

出　　处：《科学技术与工程》2007年第17期4364-4368,共5页Science Technology and Engineering

基　　金：国家自然科学基金(60173042)资助

摘　　要：始于90年代的瞬态电流测试(I_(DDT) Testing)法可以检测出传统的电压测试法和稳态电流测试法所不能检测出的集成电路故障。瞬态电流测试产生需要一次产生两个或两个以上向量。其测试向量产生比较复杂,寻找高效的测试向量产生算法对提高测试效率具有重要意义。提出了一种基于模拟测试的蚂蚁路径瞬态电流测试产生算法。通过蚂蚁算法的自适应与正反馈的特点,寻找出一条测试集成电路故障的最佳路径,该算法思想简单,易于实现。通过SPICE模拟验证表明测试产生的结果是有效的。IDDT testing originating in the nineties can check integrated circuit fault which can not be checked through the voltage testing and IDDQtesting. IDDT testing needs to generate two or more vectors at a time. The testing generation algorithm is complex. So finding an efficient algorithm has important signification for improving the testing. This paper proposes a new algorithm for transient current test generation based on ant route in simulation test, and finds one of the best ways of checking integrated circuit fault using the feature of self-accomodation and positive feedback in ant algorithm. The algorithm is very simple and easy to realize. SPICE simulation tests show that the test result is efficient.

关 键 词：瞬态电流 蚂蚁算法 SPICE模拟 测试产生 

分 类 号：TP933[自动化与计算机技术]