用迈克尔逊干涉仪测量隐失场  

Measurement of Evanescent Field by Michelson Interferometer

作　　者：徐平[1] 钱建强[1] 余威[1] 蔡微[1] 姚骏恩[1] 

机构地区：[1]北京航空航天大学理学院,北京100083

出　　处：《光电子．激光》2007年第8期970-972,共3页Journal of Optoelectronics·Laser

基　　金：国家自然科学基金资助项目(10427401)

摘　　要：提出了一种用迈克尔逊干涉仪探测隐失场的方法。利用切向力调制方法确定安装在双压电陶瓷片上光纤探针与样品间的最小距离,通过压电陶瓷管控制探针移动,用光电倍增管测量光纤探针的输出光信号强度,获得了全内反射产生的隐失场度随探针与样品间距增加而快速衰减的特性曲线。结果表明,这种测量装置具有结构简单可靠、操作方便等特点。We present a method to measure the evanescent field by Michelson interferorneter. The optical fiber probe is glued on a piezoelectric bimorph,and the initial position between the tip and the smple surface is controlled based on shear force detection method. With the decrease of the voltage applied on the PZT tube,the tip-sample distance is controlled,at same time the optical intensity of evanescent field generated by total internal reflection is detected by a photornultiplier,the function of evanescent filed intensity-distance between probe and sample surface can be obtained. This kind of device is simple and easy to operate;also it has the advantage of high reliability.

关 键 词：迈克尔逊干涉仪 隐失场 双压电陶瓷片 光纤探针 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置]