Study of white light emission from ZnS/PS composite system  被引量:1

Study of white light emission from ZnS/PS composite system

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作  者:王彩凤 李清山 吕磊 张立春 齐红霞 

机构地区:[1]College of Physics and Engineering,Qufu Normal University

出  处:《Chinese Optics Letters》2007年第9期546-548,共3页中国光学快报(英文版)

基  金:the Natural Science Foundation of Shandong Province under Grant No.Y2002A09.

摘  要:ZnS films were deposited by pulsed laser deposition (PLD) on porous silicon (PS) substrates formed by electrochemical anodization of p-type (100) silicon wafer. The photoluminescence (PL) spectra of ZnS/PS composites were measured at room temperature. Under different excitation wavelengths, the relative integrated intensities of the red light emission from PS layers and the blue-green emission from ZnS films had different values. After samples were annealed in vacuum at different temperatures (200, 300, and 400 ~C) for 30 min respectively, a new green emission located at around 550 nm appeared in the PL spectra of all ZnS/PS samples, and all of the ZnS/PS composites had a broad PL band (450 - 700 nm) in the visible region, exhibiting intensively white light emission.ZnS films were deposited by pulsed laser deposition (PLD) on porous silicon (PS) substrates formed by electrochemical anodization of p-type (100) silicon wafer. The photoluminescence (PL) spectra of ZnS/PS composites were measured at room temperature. Under different excitation wavelengths, the relative integrated intensities of the red light emission from PS layers and the blue-green emission from ZnS films had different values. After samples were annealed in vacuum at different temperatures (200, 300, and 400 ~C) for 30 min respectively, a new green emission located at around 550 nm appeared in the PL spectra of all ZnS/PS samples, and all of the ZnS/PS composites had a broad PL band (450 - 700 nm) in the visible region, exhibiting intensively white light emission.

关 键 词:Light emission PHOTOEXCITATION PHOTOLUMINESCENCE Porous silicon Pulsed laser deposition Silicon wafers Thin films 

分 类 号:O472.3[理学—半导体物理]

 

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