微波扫描移相器在电光采样系统中的应用  

The Application of Microwave Scanning Phase Shifter to Electro Optic Sampling System

作　　者：田小建[1,2] 衣茂斌[1,2] 孙伟[1,2] 李正庭[1,2] 周波 

机构地区：[1]吉林大学电子工程系 [2]集成光电子国家重点联合实验室吉林大学实验区

出　　处：《微电子学》1997年第2期130-132,共3页Microelectronics

摘　　要：介绍了一种可用于电光采样系统的微波扫描移相器，其线性度≤１．４％，插入损耗≤４．０５ｄＢ。用此移相器组成的电光采样测试系统测量了高速门电路波形。A microwave scanning phase shifter for electro optic sampling systems has been developed, which has the linearity less than ±1.4% and insertion loss less than 4.05 dB. The electro optic sampling system based on the phase shifter has been used to measure the waveform of a high speed gate circuit. The method for sweep interval scaling is discussed.

关 键 词：电光采样 移相器 微波扫描 集成电路 测试 

分 类 号：TN407[电子电信—微电子学与固体电子学] TN623