FT51:一种容软错误高可靠微控制器  被引量:14

FT51:A Soft Error Tolerant High Reliable Micro Controller

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作  者:龚锐[1] 陈微[1] 刘芳[1] 戴葵[1] 王志英[1] 

机构地区:[1]国防科技大学计算机学院,长沙410073

出  处:《计算机学报》2007年第10期1662-1673,共12页Chinese Journal of Computers

基  金:国家自然科学基金(90407022)资助.~~

摘  要:文中给出一种容软错误高可靠微控制器FT51.首先它具有基于异步电路的时空三模冗余结构,采用此结构可以对时序逻辑单事件翻转(SEU)和组合逻辑单事件瞬态(SET)进行防护.所有的片内存储器采用Hamming编码进行防护.针对现有控制流检测的不足,该设计采用了软硬件结合的控制流检测与恢复机制.FT51在HJTC0.25μm工艺下进行了实现,与未经加固的版本相比,其额外的面积开销为80.6%,额外的性能开销为19%~133%.文中还提出了一种微处理器可靠性评估框架,在此框架下通过模拟和理论推导证明:典型情况下FT51的故障检出和屏蔽率为99.73%.This paper proposes a soft error tolerant high reliable micro controller, FT51. Temporal spatial triple modular redundancy based on asynchronous circuit technique is designed to tol- erate SEU (Single Event Upset) in sequential logic and SET (Single Event Transient) in combinational logic. On-chip memory is protected by Hamming code. Control flow checking and recovering by compiler signature and hardware checking is designed to reduce performance overhead and binary code size overhead in traditional software implemented control flow checking. A relia- bility evaluation method is also proposed in this paper. FTS1 is implemented in HJTC 0. 25μm process, with 80. 6% area overhead and 19%-133% performance overhead. The results of simulation and theoretical verification indicate that FTSI can mask or detect 99. 73% faults under typical condition.

关 键 词:微控制器 软错误 单事件翻转 单事件瞬态 时空三模冗余 控制流检测 

分 类 号:TP332[自动化与计算机技术—计算机系统结构]

 

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