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机构地区:[1]上海大学,嘉定校区
出 处:《应用科学学报》1997年第1期107-111,共5页Journal of Applied Sciences
摘 要:测量了Te溶液生长半磁半导体(SMSC)Cd1-MnTe的导电类型、电阻率、霍尔迁移率和光致发光(PL).测定结果表明,Te溶液生长Cd1-xMnxTe晶体质量和稳定性均优于布里奇曼长晶,根据正四面体配位晶场中Mn2+3d(4T1)能级出现在Cd1-xMnxTe禁带中的观点,分析了在0.85~1.5μm范围内红外透射光谱上存在吸收边的原因。The receptivity, conductive type, Hall mobility and photoluminescence (PL) of semimagnetic semiconductor (SMSC) Cd1-aMnxTe crystal films grown from Te-ricb solution were measured. All these results showed that the quality and stability of crystal films grown were better than Cd1-xMnxTe bulk crystal grown by Bridgeman technique. The cause of absorptive edge existing within 0.85 -1.5 μm range in infrared transmittance spectrum was investigated based on the viewpoint that the first excited state (4T1) of Mn2+3d in tetrahedral crystal field appeared in the bandgap of Cd1-xMnxTe crystal.
分 类 号:TN304.26[电子电信—物理电子学]
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