一种检测冗余故障的瞬态电流测试方法  

A Method to Test Redundant Faults Using IDDT Testing

作　　者：崔昌明[1] 邝继顺[1] 蔡烁[1] 

机构地区：[1]湖南大学计算机与通信学院,湖南长沙410082

出　　处：《微电子学与计算机》2007年第11期77-79,82,共4页Microelectronics & Computer

基　　金：国家自然科学基金项目(60173042)

摘　　要：数字电路中的冗余故障是不能被传统的电压测试方法(VoltageTesting)和稳态电流测试方法(IDDQTest-ing)检测出来的。根据瞬态电流测试(IDDQTesting)的思想,提出一种检测冗余故障的方法,该方法利用扇出重汇聚结构当中从扇出点到重汇聚点的不同路径的延迟差,在重汇聚点形成冒险,以激活故障并进行传播。实验表明,此方法能够有效地检测冗余故障。The redundant faults in digital circuit can＇t be detected by voltage testing and IDDQ testing. In this paper, a method to test redundant faults is presented based on IDDQ testing. This method uses the difference of delay between different paths in reconvergent fanout structure to engender a risk at the reconvergent node, in order to activate and transmit the fault. SPICE simulation experiments were done on the testing pairs generated by this method. Experimental resuits show that, for all of the redundant faults in the circuit, testing pairs generated by this method can arouse great difference between the transient power supply currents of the fault circuit and the fault free circuit. All these results proved that this method can effectively detect the redundant faults, and it is helpful for improving the fault coverage.

关 键 词：数字电路 冗余故障 瞬态电流测试 

分 类 号：TP331[自动化与计算机技术—计算机系统结构]