嵌入式存储器内建自测试的一种新型应用  

A New Application of Embedded Memory BIST

作　　者：孙华义[1] 郑学仁[1] 闾晓晨[1] 王颂辉[1] 吴焯焰[1] 

机构地区：[1]华南理工大学微电子研究所

出　　处：《中国集成电路》2007年第11期82-87,共6页China lntegrated Circuit

摘　　要：当今,嵌入式存储器在SoC芯片面积中所占的比例越来越大,成为SoC芯片发展的一个显著特点。由于本身单元密度很高,嵌入式存储器比芯片上面的其它元件更容易造成硅片缺陷,成为影响芯片成品率的一个重要因素。本文对采用MARCH-C算法的嵌入式存储器内建自测试进行了改进,实现了对嵌入式存储器故障的检测和定位,能够准确判断故障地址和故障类型,使嵌入式存储器故障修复更加快捷、准确,同时达到故障覆盖率高、测试时间短的目的。Embedded memory has been taking more and more area in SoC, which has become a remarkable character for SoC. With the high density, embedded memory is much easier to result in fault than any other components on the chip. This paper develops the traditional method of BIST and works out a new memory BIST method with the function of fault checking and debugging, and the MARCH algorithm is implemented in the method in order to keep high fault coverage. When the method is applied with real memory model, it is found that it could find the faults and point out them, at the same time, with less test time and high fault coverage.

关 键 词：SOC 嵌入式存储器 MARCH算法 故障检测 

分 类 号：TN407[电子电信—微电子学与固体电子学]