GeV能量的Fe离子在C_(60)薄膜中的辐照效应研究  

Irradition Effect in C_(60) Films Induced by GeV Fe Ions

作　　者：姚存峰[1] 金运范[1] 宋银[1] 王志光[1] 刘杰[1] 孙友梅[1] 张崇宏[1] 段敬来[1] 

机构地区：[1]中国科学院近代物理研究所

出　　处：《原子核物理评论》2007年第4期309-312,共4页Nuclear Physics Review

基　　金：国家自然科学基金资助项目(10175084;10675150)~~

摘　　要：利用傅立叶转换红外光谱和Raman谱仪分析了0.98GeV的Fe离子在电子能损Se为3.5keV/nm时,不同辐照剂量(5×1010—8×1013ions/cm2)下,在C60薄膜中引起的辐照损伤效应。分析表明,Fe离子辐照引起了C60分子的聚合与损伤。在辐照剂量达到一中间值1×1012ions/cm2,C60分子的损伤得到部分恢复,归因于电子激发引起的退火效应。通过对Raman数据的拟合分析,演绎出Fe离子辐照在C60材料中形成的潜径迹截面或引起损伤的截面约为1.32×10-14cm2。The irradiation effects of C6o films induced by 0.98 GeV Fe ions at the same electronic energy loss of 3.5 keV/nm and different irradiation dose ranging from 5 ×10^10 to 8 × 10^13 ions/cm^2, were analyzed by Raman scattering and Fourier transform infrared （FTIR） spectroscopes. The analysis results indicate that the irradiation results in a molecular polymerization and destruction of the C60. The partial recovery of the damage at the intermediate value of irradiation dose, 1 × 10^12 ions/cm^2, was caused by an annealing effect of electronic energy loss. The ion track or damage cross-section σ deduced from the Raman data was 1.32 × 10^-14 cm^2.

关 键 词：C60薄膜 辐照效应 GeV能量的离子 退火效应 聚合 

分 类 号：O571.33[理学—粒子物理与原子核物理]