一种高灵敏度X射线密度测量技术  

A new X-ray density measurement technique with high sensitivity

作　　者：戴振麟[1] 葛良全[1] 邹德慧[1] 赖万昌[1] 

机构地区：[1]成都理工大学核技术与自动化工程学院,四川成都610059

出　　处：《核电子学与探测技术》2007年第5期954-957,共4页Nuclear Electronics & Detection Technology

基　　金：中国地质调查局地质调查项目(编号:1212010560204)的部分研究成果

摘　　要：介绍了一种高灵敏度X射线密度测量的基本原理以及基于此原理研制的X射线密度仪。采用FP法迭代计算出被测物质中各元素的含量,再由密度公式算出该物质的密度。该密度仪的软件部分用C语言编写,人机交互界面友好,初步应用表明其稳定性较好、灵敏度高,测得饱和厚度合金样的密度与其理论计算值相吻合,此X射线密度仪有很好的应用前景。This paper introduces a new density measurement technique based X-ray fluorescence analysis and the X-ray density apparatus has been developed.We make use of FP-method to obtain the content of each element in the substance measured through iterative calculation,and then the density of this substance could be calculated by the density formula.The density apparatus whose software is programmed by C language has a good man-machine interface.The primary application of this density apparatus shows it is not only of better stability but also of high sensitivity.The numerical values of the density of alloy samples with saturated thickness measured with this apparatus fit well with those calculated by theory.This density apparatus has a good future of its application.

关 键 词：X射线 密度仪 FP法 软件设计 

分 类 号：TH715.2[机械工程—测试计量技术及仪器]