BGO晶体生长固液边界层结构的微区研究  

Analysis on Raman Spectra of Growth Solid-liquid Boundary Layer of BGO Crystal

作　　者：张霞[1] 万松明[1] 殷绍唐[1] 尤静林[2] 陈辉[2] 赵思杰[2] 张庆礼[1] 

机构地区：[1]中国科学院安徽光学精密机械研究所,合肥230031 [2]上海大学上海市钢铁冶金新技术开发应用重点实验室,上海200072

出　　处：《人工晶体学报》2007年第6期1245-1248,共4页Journal of Synthetic Crystals

基　　金：国家自然科学基金(No.50472104)资助项目

摘　　要：研究了BGO晶体固/液边界层及其两侧晶体和熔体的高温拉曼光谱,分析了BGO晶体生长固/液边界层以及边界层两侧晶体和熔体的结构特征。结果显示,桥氧键Bi-O-Ge和O-Bi-O在晶体和边界层中都存在,而在熔体中消失。说明[GeO4]和[BiO6]结构基团在晶体及边界层中都存在,边界层中的结构已接近晶体结构;但在熔体中[GeO4]结构基团和Bi3+却是两种独立的存在,长程有序的晶体结构消失。并首次报道了BGO晶体固/液边界层的厚度约为50μm。The high-temperature Raman spectra of the growth solid-liquid boundary layer of BGO crystal were studied. The structure characters in boundary layer, melts and crystal were analyzed. The results show that there exits [ GeO4 ] polyhedral structure and Bi ion independently in BGO melt. The bridge bonds Bi-O-Ge and O-Bi-O are present in both the crystal and boundary layer, but disappear in the melt. The structure of the growth solid-liquid boundary layer is similar to that of BGO crystal. In the melt, the long-range order structure of the crystal disappears. Finally, we obtained the thickness of the growth solid-liquid boundary layer of BGO crystal for first time, it is about 50μm.

关 键 词：固/液边界层 高温拉曼光谱 BGO晶体 实时观测 

分 类 号：O78[理学—晶体学]